Analog Electronic Circuit Test Training Chamber Electronics Trainer

• Customization: Available
• Condition: New
• Customized: Customized
• Model NO.: GCWH1-MNDZ1
• Material: PVC
• Type: Module Assembly
• Transport Package: Plywood or Carton
• Trademark: GeeChin
• Origin: China
• HS Code: 9023009000
• Production Capacity: 50

Product Description

Analog Electronic Circuit Test Training Chamber Electronics Trainer

PRODUCTION INTRODUCTION

The modular design is used to facilitate the upgrade of the experimental box and the secondary development of students.
The experimental box is divided into modules, and the schematic diagram or component identifier of each module is drawn on the surface of the experimental box.
The test box is distributed in each module with discrete components, and the circuit is connected by connection.

TECHNICAL PARAMETERS

DC signal source: dual continuous adjustment, -12V~+12V;
4PCS independent potentiometers: 1K, 10K, 50K, 100K;
Provide simple signal source: three-way square wave, triangular wave, sine wave, frequency and duty cycle, amplitude are adjustable.
 

Power	Input AC 220V±10%; Output: DC +5V/3A, +12V/1A, -12V/0.5A, -5V/0.5A; AC: 7.5V, 15V;
Temperature	-10degree ~ 40 degree
Size	700*500*300MM

TRAINING ITEM

Unit experiment
Function signal generator debugging experiment.
Transistor common emitter single tube amplifier experiment.
Transistor two-stage amplifier experiment.
Field effect tube amplifier experiment.
Negative feedback amplifier experiment.
The emitter follower experiment.
Differential amplifier experiment.
RC sine-wave oscillator experiment.
LC sine-wave oscillator experiment.
Integrated operational amplifier index test experiment.
Basic applications of integrated operational amplifiers (I) -- Analog operational circuit experiments.
Basic applications of integrated operational amplifiers (II) - Waveform generator experiment.
Basic applications of integrated operational amplifiers (III) - Active Filter experiments.
Basic applications of integrated operational amplifiers (IV) - Voltage Comparator experiments.
Voltage-frequency conversion circuit experiment.
Low Frequency Power Amplifier (I) - OTL power amplifier experiment.
Low Frequency Power Amplifier (II) - Integrated power amplifier.
DC Regulated Power Supply (I) - Transistor regulated power supply experiment.
DC Regulated Power Supply (II) - Integrated Voltage regulator experiment.
Thyristor controlled rectifier circuit experiment.

Comprehensive application experiment
Comprehensive application experiment -- temperature control circuit experiment.
Comprehensive application experiment -- waveform conversion circuit experiment.